Electrostatic tip-dielectric sample interaction in electrostatic force microscopy
DOI:
https://doi.org/10.17533/udea.redin.14929Keywords:
Electrostatics, charge induction, force gradient, AFM, EFM, electret, cantileverAbstract
Electric force microscopy is a local technique for measuring electrical properties of materials. The electrostatic force gradient measurements on dielectric samples are sensitive not only to the initial charge distribution in the sample but also to the charge induced by the conductive bias cantilever. Interpreting the contribution of each single effect on the charge distribution images is a challenge in the existing EFM technique. Here, a theoretical model is introduced to study the charge and induction effect on charged dielectric samples and commercial geometries for EFM tips. This model estimates the initial charge of the sample based on force gradient measurements. Gradient force results reproduce experimental measurements performed on electrets samples.
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F. J. Giessibl. “Theory of electric force microscopy in the parametric amplification regime”. Physical Review B. Vol. 71. 2005. pp. 1-12. DOI: https://doi.org/10.1103/PhysRevB.71.205404
K. L. Sorokina, A. L. Tolstikhina. “Atomic Force Microscopy Modified for Studying Electric Properties of Thin Films and Crystals. Review”. Crystallography Reports. Vol. 49. 2004. pp. 476–499. DOI: https://doi.org/10.1134/1.1756648
M. S. Crosser, S. H. Tessmer, R. N. Ghosh. “Scanning Electric Field Sensing for semiconductor dopant profiling”. Applied Surface Science. Vol. 195. 2002. pp. 146-154. DOI: https://doi.org/10.1016/S0169-4332(02)00538-X
B. Bharat (Editor). Springer Handbook of Nanotechnology. 2a ed. Ed. Springer-Verlag. Heildelberg. 2007. pp. 325-385.
J. Kim, W. Jasper, J. Hinestroza. “Direct probing of solvent-induced charge degradation in polypropylene electret fibres via electrostatic force microscopy”. Journal of Microscopy, Vol. 225. 2007. pp. 72-79. DOI: https://doi.org/10.1111/j.1365-2818.2007.01716.x
G. M. Sacha, J. J. Sáenz. “Cantilever effects on electrostatic force gradient microscopy”. Applied Physics Letters. Vol. 85. 2004. pp. 2610-2612. DOI: https://doi.org/10.1063/1.1797539
G. M. Sacha, C. Gómez Navarro, J. J. Sáenz, J. Gómez Herrero. “Quantitative theory for the imaging of conducting objects in electrostatic force microscopy”. Applied Physics Letters. Vol. 89. 2006. pp. 173122- 173125. DOI: https://doi.org/10.1063/1.2364862
S Gómez Moñivas, L. S. Froufe, R. Carminati, J. J. Greffet, J. J. Saenz. “ Tip-shape effects on electrostatic force microscopy resolution”. Nanotechnology. Vol. 12. 2001. pp. 496-499. DOI: https://doi.org/10.1088/0957-4484/12/4/323
S. Gómez Moñivas, L. S. Froufe Pérez, A. J. Caamaño, J. J. Sáenz. “Electrostatic forces between sharp tips and metallic and dielectric samples”. Applied Physics Letters. Vol. 79. 2001. pp 4048-4050. DOI: https://doi.org/10.1063/1.1424478
W. J. Jasper, A. Mohan, J. Hinestroza, R. Barker. “Degradation Processes in Corona-Charged Electret Filter-Media with Exposure to Ethyl Benzene”. Journal of Engineered Fibers and Fabrics. Vol. 2. 2007. pp 1-6. DOI: https://doi.org/10.1177/155892500700200401
J. Colchero, A. Gil, A. M. Baro. “Resolution enhancement and improved data interpretation in electrostatic force microscopy”. Physical Review B. Vol 64. 2001. pp 245403.1-245403.11. DOI: https://doi.org/10.1103/PhysRevB.64.245403
Mikromasch Corporation. Probe Catalog. http://www.spmtips.com/spm_probes/ Consultada el 15 de abril de 2008.
D. J. Griffiths. Introduction to Electrodynamics. Ed. Prentice-Hall Inc. New Jersey. 1999. pp.1-193.
G. Téllez. Métodos Matemáticos, Universidad de los Andes, Dpto. de Física. 2002, pp. 135-174.
Veeco Corporation, AFM Probes. https://www. ve e coprobe s .com/ s e a r ch. a sp?GroupID=42. Consultada el 20 de abril de 2008.
J. A. Małecki. “Linear decay of charge in electrets”. Physical Review B. Vol. 59. 1999. pp. 9954-9960. DOI: https://doi.org/10.1103/PhysRevB.59.9954
J. E. J. Dalley, R. S. Greenaway, Z. Ulanowski, E. Hesse, P. H. Kaye. “Measurement of the charge of airborne 3–10 m spherical dielectric particles charged in an AC unipolar charger”. Journal of Aerosol Science. Vol. 36. 2005. pp. 1194-1209. DOI: https://doi.org/10.1016/j.jaerosci.2005.02.008
A. Gómez. Estudio de la interacción punta-muestra dieléctrica en microscopios de fuerza atómica. Trabajo de Pregrado. Ingeniería electrónica. Universidad de los Andes. 2008.
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